Non-Contact Chamfer Gauging System
The IES chamfer gauging system is presently used as a manual load bench top unit. Automatic load/unload versions are available as well as custom inline process integrated versions.
IES Inner & Outer Chamfer Inspection Results Display
ID/OD Chamfer gauging system features
- Instant inspection results
- Simultaneous inner & outer chamfer depth and angle gauging
- Gauging accuracy – 12.5microns (.0005”)
- Pass/Fail indication with failure location
- Data collection excel formatted
- Library of customer-specific part sizes
- Easy to use – no special computer skills required
Benchtop Inline Process Gauging
Inline operation with multi-size chamfer gauging capabilities offers high versatility usage.
Contact IES for pricing.